Scientists at the Centre for Solar Energy and Hydrogen Research Baden-Württemberg (ZSW) now have a far more powerful tool to better investigate solar cells – a new scanning electron microscope.
In full operation since January 2020, this device has twice the resolution of its predecessor and the ability to image structures measuring just a few nanometers. Its focused ion beam cuts cross-sections of layers smoothly and precisely. Researchers aim to gain a better understanding of thin-film solar cells’ structure
and interfaces on a nanoscale. They also want to gain deeper insights into defects. This knowledge is crucial to the solar industry’s efforts to assure quality and continue to boost solar cells’ efficiency. More efficient solar cells can further shrink photovoltaic systems’ small CO2 footprint and boost PV’s contribution to mitigating climate change.
A video at www.zsw-bw.de/en/media-center/videos.html shows the advantages of the new scanning electron microscope with a focused ion beam – or FIB-SEM for short.
Please find the complete press release below under "Downloads".