X-ray fluorescence analysis (XRF) is a standard method for the fast and non-destructive determination of film thicknesses and elemental compositions of solids and liquids. XRF can be measured at individual points or the homogeneity mapped over an area of up to 30 x 30 cm2. The information depth for XRF is several micrometers.
XRF, surface analysis methods, and scanning electron microscopy with EDX, are also available for external customers. Questions regarding the chemical composition and structure of surfaces, thin films, and compact materials often require the combined application of all of these techniques. By virtue of our many years of experience in the analysis of semiconductors, metal alloys, plastics, ceramics, coated glasses, compound materials, and other materials, we can quickly adjust to your special analytical requirements.