// UV-VIS-NIR Spectroscopy

The UV-VIS-NIR spectroscope "Lambda 900" is being used the determination of transmission and reflection in a maximum range of 175 - 3300 nm. In combination with theoretical modelling, a wide range of material parameters can be calculated from this data e.g. to control the quality of thin films. Typically, the films are deposited on substrates with dimensions ranging from about 20 x 20 mm² up to 100 x 100 mm². Liquid samples are measured in cuvettes.

We offer transmission and/or reflection measurements as a service for companies and institutions in or beyond the field of photovoltaics.

Fields of Application

  • Thickness determination of thin (0.1 - some µm), transparent films
  • Determination of absorption coefficients of liquid solutions or solids like glass, polymers, etc.
  • Determination of optical constants (refractive index, absorption index, reflectivity)
  • Determination of hue/turbidity/UV-blocking of filters, coatings, foils, mirrors, sun blockers, etc.
  • Analysis of wine and beer

Equipment

  • UV-VIS-NIR spectrometer "Lambda 900" from Perkin-Elmer (175 - 3300 nm)
  • Integration sphere "PELA-1000" from Perkin-Elmer for scattering samples (250 - 2500 nm)
  • Reflection accessory for specular samples (250 - 2500 nm)

 

Contact

Dr. Oliver Kiowski
+49 (0)711 78 70-266
[BU:] Determining the optical constants (n, k) and the thickness of rf-sputtered ZnO layers using the 'Lambda 900' UV-VIS-NIR spectrometer:
(a) Transmission measurement and fit of 2 layers of unknown thickness
(b) Reflectance measurement and fit of the same layers
(c) Refraction and absorption index as yielded by (a) and (b)