ZSW operates a state-of-the-art high-resolution scanning electron microscope (HR-SEM) with a Schottky field emission gun. The HR-SEM can image the morphology of materials and is therefore particularly suited for the examination of very thin films in the micro- or nano-metre size range. The areas of application for this technique range from materials research and development to quality control and failure analysis.
Besides the imaging of surfaces, the electron microscope offers the possibility to qualitatively or quantitatively determine the elemental composition of the sample with the help of an additional detector for energy dispersive x-ray microanalysis (EDX) attached to the HR-SEM.
We offer scanning electron microscopy and x-ray microanalysis as a service for external customers from industry and research.